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Scanning Accoustic Microscope
Semiconductor Package Failure Analysis
voids · disbonds · cracks · delamination · internal defects
Included Software Modes:
  • Basic (user friendly)
  • Advanced (detailed analysis)
  • Production (automated scanning)
  • Offline Analysis (virtual scanning)
OKOS Digital Imaging System (ODIS)
MACROVUE-P imaging power surpasses modern standards delivering premium FA Lab features to semiconductor fabrication facilities. ODIS is the latest Acoustic Microscopy software with rich technical content built on current platforms and industry feedback.
Advanced analysis is provided through quantitative tools for measurement and classification of parts.
The Analysis version of ODIS allows non-scanning computers to
virtually scan, view, and analyze data for simultaneous real-time
analysis or post collection review.
  • Counterfeit Detection
  • Product Reliability
  • Process Validation
  • Vendor Qualification
  • Product Inspection
  • Quality Control
  • Failure Analysis
  • R&D
Application Specific Transducers
for the highest quality resolution
Multiple transducer design for enhanced scan capability.

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