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Semiconductor Package Failure Analysis
voids · disbonds · cracks · delamination · internal defects

The SCANNING ACOUSTIC MICROSCOPY VUE 250-P is the most compact model scanner from OKOS designed with advanced instrumentation and software to meet Failure Analysis lab requirements.

The Vue 250-P offers many features and benefits such as high clarity & contrast images, unlimited web-based support, and unlimited remote training. Customizable options include: Windows 10 operating system (32 or 64 bit), a variety of ultrasonic immersion transducers, through transmission capability, specialized remote pulsers, and a second digital pulser-receiver channel.

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