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Contamination Standards
Absolute Contamination Standards
- Substrate Deposited Polystyrene Latex Spheres
- For use with Scanning Surface Inspection Systems (SSIS)
Edge Contamination Standards
- Edges of Substrate Deposited Polystyrene Latex Spheres
- For use with Edge Contamination Detection Systems
Reticle Contamination Standards
- Spheres deposited on photomasks / test plates
- For use with reticle and pellicle inspection systems
Silica Contamination Standards
- Substrate Deposited highly spherical Silica Spheres
- For use with Advanced Scanning Surface Inspection Systems (SSIS)