Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. The Sentris thermal imaging microscope pinpoints the low-level infrared thermal emissions by IC faults such as short circuits and leakage current.
Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. The Sentris thermal imaging microscope pinpoints the low-level infrared thermal emissions by IC faults such as short circuits and leakage current.
We are proud to announce that JPK entered into a partnership with ITC to promote its probe card analyzers, and power semiconductor test systems. JPK will be responsible for sales and service support in Europe.
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The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB. With 300Kg of lift force, it has long been recognized as the analyzer of choice for vertical probe card manufacturers.
John P. Kummer AG is now a member of the Swiss Aerospace Cluster - the industrial network for Swiss companies in aerospace and satellite navigation as well as universities, research institutions, etc.
Zur Verstärkung unseres Vertriebs suchen wir für den Standort Augsburg befristet (2 Jahre) und in Vollzeit ab sofort eine(n)
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Nachfolgend finden Sie eine vollständige Terminübersicht unseres Schulungsangebots für das Jahr 2020. Detaillierte Angaben zum Schulungsinhalt vom 17.06.2020 finden Sie in unserem Flyer.